High-sensitivity SQUIDs with dispersive readout for scanning microscopy

ORAL

Abstract

In a scanning SQUID microscope, the high magnetic flux sensitivity is utilized to image magnetic properties of sample surfaces. As an alternative to the widely used DC SQUIDs, we present Nb SQUIDs for scanning with dispersive microwave readout, featuring significantly higher bandwidth and sensitivity. An on-chip shunt capacitor in parallel with the junction and flux pickup loops forms an LC resonator whose resonance depends on the flux in the SQUID. The readout utilizes a phase-sensitive detection of the reflected drive signal at the SQUID's resonance frequency. Highest sensitivities are achieved by making use of the inherent nonlinearity of the device at high excitation powers. We present a study of the characteristics and noise measurements of our sensors at 4 K. Extrapolations from our results to 300 mK indicate that flux sensitivities as low as 50 n$\Phi_{0}$Hz$^{-1/2}$ could be possible. Using high-resolution lithography, our sensors promise sub-micron spatial resolution. Integrated into a scanning microscope, they will provide a powerful tool for the study of weak magnetic effects and quantum coherent phenomena.

–

Authors

  • J.M. Mol

    RWTH Aachen University

  • F. Foroughi

    RWTH Aachen University

  • J. Arps

    RWTH Aachen University

  • E. Kammerloher

    RWTH Aachen University

  • P. Bethke

    RWTH Aachen University

  • G.W. Gibson, Jr.

    IBM Research Division, T.J. Watson Research Center

  • Y.K.K. Fung

    IBM Research Division, T.J. Watson Research Center

  • B. Klopfer

    Stanford University

  • K. Nowack

    Stanford Institute for Materials and Energy Sciences, Stanford University

  • P.A. Kratz

    Stanford University, Departments of Physics and Applied Physics, Stanford University, Stanford, California 94305, USA

  • M.E. Huber

    University of Colorado, University of Colorado Denver

  • K.A. Moler

    Stanford Institute for Materials and Energy Sciences, Stanford University, Departments of Physics and Applied Physics, Stanford University, Stanford, California 94305, USA

  • J.R. Kirtley

    Stanford University

  • H. Bluhm

    2nd Institute of Physics C, RWTH Aachen University, Department of Physics, RWTH Aachen University, D-52074 Aachen, Germany, RWTH Aachen University