Characterization of line defects in CVD graphene films with scanning plasmon interferometry

ORAL

Abstract

Line defects that are omnipresent in graphene films fabricated with chemical vapor deposition method (CVD) were studied with scanning plasmon interferometry (SPI)---a technique capable of convenient nano-characterization of graphene devices in ambient conditions. The characteristic SPI patterns of line defects are plasmonic twin fringes, which are generated due to interference between surface plasmons (SPs) of graphene launched by a scanning probe and reflected by the line defects. The twin fringes allow us to visualize and distinguish various types of line defects including cracks, wrinkles, and even grain boundaries. Further modeling of the twin fringes provides detailed information on the electronic properties associated with these line defects.

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Authors

  • Zhe Fei

    University of California - San Diego, University of California, San Diego

  • Aleksandr Rodin

    Boston University, University of California, San Diego

  • Will Gannett

    University of California, Berkeley

  • Siyuan Dai

    University of California, San Diego

  • William Regan

    University of California, Berkeley

  • Aleksandr Rodin

    Boston University, University of California, San Diego

  • Martin Wagner

    University of California San Diego, University of California, San Diego

  • Benji Aleman

    University of California, Berkeley

  • Mark Thiemens

    University of California, San Diego

  • Gerardo Dominguez

    California State University, San Marcos

  • Antonio H. Castro-Neto

    National University of Singapore, National University of Singapore and Boston University

  • Alex Zettle

    University of California, Berkeley / Lawrence Berkeley National Laboratory, University of California, Berkeley

  • Fritz Keilmann

    Max Planck Institute of Quantum Optics

  • Michael Fogler

    University of California - San Diego, University of California, San Diego

  • Dmitri Basov

    University of California - San Diego, University of California San Diego, University of California, San Diego