Invited Session: Frontiers in Nanomanufacturing: Atomic Scale Metrology, Large Scale Industry Technology Challegnes and Inherent Device Limitations

Presentations

• Time-Resolved, Atomic-Resolution Imaging of Metastable Atom Configurations

  COFFEE_KLATCH · Invited

  March 19, 2013, 11:15 AM – March 19, 2013, 11:51 AM

  Authors

  • Christian Kisielowski

    Lawrence Berkeley National Laboratory, Berkeley CA 94720

  View abstract →

• TBD

  COFFEE_KLATCH · Invited

  March 19, 2013, 11:51 AM – March 19, 2013, 12:27 PM

  Authors

  • Thomas Albrecht

    HGST, San Jose Research Center

  View abstract →

• Scalable fabrication of nanostructured devices on flexible substrates using additive driven self-assembly and nanoimprint lithography

  COFFEE_KLATCH · Invited

  March 19, 2013, 12:27 PM – March 19, 2013, 1:03 PM

  Authors

  • James Watkins

    Polymer Science and Engineering Department at University of Massachusetts Amherst, Department of Polymer Science and Engineering, University of Massachusetts Amherst, University of Massachusetts Amherst, University of Massachusetts

  View abstract →

• to be determined

  COFFEE_KLATCH · Invited

  March 19, 2013, 1:03 PM – March 19, 2013, 1:39 PM

  Authors

  • Asen Asenov

    University of Glasgow

  View abstract →

• Imagining and Imaging Future Devices: A Physicist's Dream

  COFFEE_KLATCH · Invited

  March 19, 2013, 1:39 PM – March 19, 2013, 2:15 PM

  Authors

  • Scott List

    Intel Corporation

  View abstract →