Atomic-scale structure and composition mapping in nickelate heterostructures

ORAL

Abstract

Strongly correlated electronic systems display a wide range of interesting properties, including ferroelectricity, superconductivity, metal-insulator transitions, and novel magnetic phenomena. The electrical and magnetic properties of thin film heterostructures based on these systems are directly linked to their atomic scale structure and composition. This link is important for the rare earth nickelates, which exhibit first-order metal-insulator transitions, antiferromagnetism, and charge ordering. At the interfaces present in these systems, structural coupling can lead to new effects. We use a synchrotron-based resonant anomalous x-ray scattering method to elucidate the physical and electronic structure at complex oxide heterointerfaces of nickelates grown using molecular beam epitaxy. Temperature dependent resonant x-ray studies in doped 8 unit-cell thick NdNiO$_3$ films reveal subtle changes in atomic structure and Ni charge disproportionation at the metal-insulator transition.

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Authors

  • Divine Kumah

    Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University

  • Ankit Disa

    Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University

  • Joseph Ngai

    Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT

  • Hanghui Chen

    Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT

  • Sohrab Ismail-Beigi

    Applied Physics, Yale University, Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University

  • Charles Ahn

    Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University

  • Fred Walker

    Yale University, Center for Research on Interface Structures and Phenomena and Department of Applied Physics, Yale University, New Haven, CT, Department of Applied Physics and Center for Research on Interface Structures and Phenomena (CRISP), Yale University