Phase Determination for Intra-unit-cell Fourier Transform STM -- Picometer Registration of Zn Impurity States in Bi$_{2}$Sr$_{2}$CaCu$_{2}$O$_{8+\delta}$
ORAL
Abstract
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Authors
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Ines Firmo
Cornell University; Brookhaven National Lab
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Mohammad Hamidian
Cornell University; Brookhaven National Lab
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Kazuhiro Fujita
Cornell, Cornell University; Brookhaven National Lab, Cornell University
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Sourin Mukhopadhyay
Cornell University; Brookhaven National Lab, Cornell University
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Joseph Orenstein
University of California, Berkeley, UC Berkeley, LBNL, UC Berkeley and Lawrence Berkeley National Laboratory, Department of Physics, UC Berkeley; Materials Science Division, LBNL, University of California, Berkeley and Lawrence Livermore National Laboratory
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Hiroshi Eisaki
AIST, National Institute of Advanced Industrial Science and Technology, Japan, Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan, National Institute of Advanced Industrial and Science Technology, Institute of Advanced Industrial Science and Technology, Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and technology
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Shin-ichi Uchida
Tokyo University, University of Tokyo, Japan, University of Tokyo, Department of Physics, University of Tokyo
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Michael Lawler
Cornell University
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Eun-Ah Kim
Cornell University
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J.C. Seamus Davis
Cornell, BNL, St. Andrews Univ., Cornell University; Brookhaven National Lab; University of St. Andrews, Scotland; Kavli Institute, Cornell, Cornell University; Brookhaven National Lab; University of St. Andrews, Scotland; Kavli Institute at Cornell, CMPMS Department, Brookhaven National Laboratory, Upton, NY 11973, USA, Cornell University, Cornell University, Brookhaven National Lab