Trend and novel challenges in spectroscopic imaging scanning tunneling microscopy for correlated electron materials research

ORAL

Abstract

In this presentation we would like to discuss the recent progress of the spectroscopic imaging scanning tunneling microscopy (SI-STM) and how the real- and momentum-space sensitive spectroscopic tool is evolving into a more robust quantum theoretical tool for the phase transition study of the correlated electron materials. \\[4pt] [1] Jhinhwan Lee, et al., Science 325, 1099 (2009).\\[0pt] [2] Michael J. Lawler, et al., Nature 466, 374 (2010).\\[0pt] [3] Colin V. Parker, et al., Nature 468, 677 (2010).\\[0pt] [4] Ilija Zeljkovic, et al., arXiv:1104.4342v1 (2011).

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Authors

  • Jhinhwan Lee

    KAIST

  • Jimin Kim

    KAIST

  • Seok Hwan Choi

    KAIST

  • Chanhee Kim

    KAIST

  • Hwansoo Suh

    Samsung Advanced Institute of Technology

  • Kazuhiro Fujita

    Cornell, Cornell University; Brookhaven National Lab, Cornell University

  • Shin-ichi Uchida

    Tokyo University, University of Tokyo, Japan, University of Tokyo, Department of Physics, University of Tokyo

  • J.C. Seamus Davis

    Cornell, BNL, St. Andrews Univ., Cornell University; Brookhaven National Lab; University of St. Andrews, Scotland; Kavli Institute, Cornell, Cornell University; Brookhaven National Lab; University of St. Andrews, Scotland; Kavli Institute at Cornell, CMPMS Department, Brookhaven National Laboratory, Upton, NY 11973, USA, Cornell University, Cornell University, Brookhaven National Lab