The Corporate Feel: Atomic Force Microscopy in Industry

Presentations

• Accelerated design and quality control of impact modifiers for plastics through atomic force microscopy (AFM) analysis

  COFFEE_KLATCH · Invited

  March 24, 2011, 3:30 PM – March 24, 2011, 4:06 PM

  Authors

  • Gunter Moeller

    Arkema Inc.

  View abstract →

• Scanning Probe Evaluation of Electronic, Mechanical and Structural Material Properties

  COFFEE_KLATCH · Invited

  March 24, 2011, 4:06 PM – March 24, 2011, 4:42 PM

  Authors

  • Kumar Virwani

    IBM

  View abstract →

• Nanomechanical characterization of polypropylene-based materials with multifrequency atomic force microscopy (AFM)-based methods

  COFFEE_KLATCH · Invited

  March 24, 2011, 4:42 PM – March 24, 2011, 5:18 PM

  Authors

  • Dalia Yablon

    Exxonmobil Research and Engineering

  View abstract →

• Probing Photovoltaic Performance

  COFFEE_KLATCH · Invited

  March 24, 2011, 5:18 PM – March 24, 2011, 5:54 PM

  Authors

  • David Ginger

    University of Washington

  View abstract →

• Challenges and opportunities for probe-based information technology

  COFFEE_KLATCH · Invited

  March 24, 2011, 5:54 PM – March 24, 2011, 6:30 PM

  Authors

  • Jeremy Levy

    U. Pittsburgh, University of Pittsburgh, Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260, U. of Pittsburgh

  View abstract →