Electronic properties of Si-C interfaces

ORAL

Abstract

In this work, we report our investigations of interfacial properties of Si-C systems. Electronic properties of Fe-doped carbon on silicon surfaces, Si-Fe-C layered structures and Si-graphene-Si junctions have been studied using first-principles calculations. Charge transfer at the interfaces, densities of states, and magnetization are fully analyzed. These problems are important because recent experiments show that Fe@C-Si materials have giant electro-resistance and magneto-resistance highly sensitive to the external magnetic field. The non-magnetic feature leads to very small magnetic noise. In addition, photovoltaic effects were also observed in some of these systems.

Authors

  • Xiang-Guo Li

    Department of Physics, University of Florida, USA

  • Hai-Ping Cheng

    Department of Physics, University of Florida, USA, Dept of Physics and QTP, Univ of Florida, Dep of Physics and Quantum Theory Project. Uni. of Florida, University of Florida, Department of Physics and Quantum Theory Project, University of Florida