Characterization investigation and evaluation of ESD robustness of high power light-emitting diodes

This paper reports on the ability of high power light-emitting diodes (LED) to endure electrostatic discharge (ESD). The en-durance of ESD is a part of reliability of LED, especially in the horizontal structure of the insulating property of the sapphire substrate. Under the test of reverse-bias stress, the endurance of ESD is stronger as the leakage current of LED is smaller. Al-though many companies adopt the vertical structure which the substrate is conductive as their products, modification of the electrical properties of LED is an important subject in reliability engineering.