Growth and characterization of multiferroic BiMnO$_{3}$ thin films

BiMnO$_{3}$ is a rare single phase, multiferroic compound which displays both ferromagnetic and ferroelectric properties. However, it is complicated to grow thin films of BiMnO$_{3 }$due to the volatility of bismuth and substrate induced strain. We have grown thin films of BiMnO$_{3}$ on SrTiO$_{3}$ (100) substrates using pulsed laser deposition. These films have a ferromagnetic $T_{C}$ of about 95 K and electric polarization vs. electric field curves have confirmed their ferroelectric properties. The structure and chemical composition of these thin films have been characterized using x-ray diffraction, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy. We will present evidence of the sensitivity of the multiferroic properties of BiMnO$_{3}$ thin films to the growth conditions and substrate induced strain.