Thermoelectric Figure-of-Merit of Nanostructured Silicon with a Low Concentration of Germanium

POSTER

Abstract

The thermoelectric properties of nanostructured silicon (Si) with a low concentration of germanium (Ge) are investigated. A low concentration of Ge leads to a significant cost reduction of the final product since Ge is at least 100 times more expensive than Si. By using only 5 atomic {\%} Ge (Si$_{95}$Ge$_{5})$, we have achieved a thermoelectric figure-of-merit (\textit{ZT}) of 0.95, similar to the \textit{ZT} in the large grained Si$_{80}$Ge$_{20}$ alloy that is three times more expensive, and is almost four times that of the large grained bulk Si. The enhancement in the thermoelectric \textit{ZT} for the nanostructured Si$_{95}$Ge$_{5}$ is mostly due to the reduced thermal conductivity caused by phonon scattering at the increased grain boundaries and the Ge alloying effect.

Authors

  • Gaohua Zhu

    Boston College

  • Hohyun Lee

    Department of Mechanical Engineering, Massachusetts Institute of Technology, MIT

  • Yucheng Lan

    Department of Physics, Boston College, Boston College

  • Xiaowei Wang

    Department of Physics, Boston College, Boston College

  • Giri Joshi

    Department of Physics, Boston College, Boston College

  • Dezhi Wang

    Boston College

  • Jian Yang

    Boston College

  • Mildred Dresselhaus

    Massachusetts Institute of Technology, MIT, Department of Physics and 2. Department of Electrical Engineering and Computer Science, MIT, ECCS, MIT, USA

  • Gang Chen

    Department of Mechanical Engineering, Massachusetts Institute of Technology, MIT, Mass. Institute of Technology

  • Zhifeng Ren

    Physics Department, Boston College, Chestnut Hill, MA 02467, Department of Physics, Boston Colleg, Boston College