Fluctuating Potentials In Micrometer Scale Atomic Ion Traps
ORAL
Abstract
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Authors
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J. Britton
NIST
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Signe Seidelin
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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John Chiaverini
NIST
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Rainer Reichle
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, U. Ulm, NIST
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John Bollinger
NIST, NIST, Boulder, CO 80305
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Didi Leibfried
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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Janus Wesenberg
NIST
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Brad Blakestad
NIST
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Ryan Epstein
NIST
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Nobu Shiga
NIST
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J.M. Amini
NIST
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Kenton Brown
NIST
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J.P. Home
NIST
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David Hume
NIST, University of Colorado
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David Hume
NIST, University of Colorado
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John Jost
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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Chris Langer
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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Roee Ozeri
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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David Wineland
NIST, NIST, Boulder, Colorado