Microfabricated surface-electrode ion traps for scalable quantum information processing
ORAL
Abstract
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Authors
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Signe Seidelin
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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Joe Britton
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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John Chiaverini
NIST
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Rainer Reichle
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, U. Ulm, NIST
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John Bollinger
NIST
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Didi Leibfried
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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Janus Wesenberg
NIST
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Brad Blakestad
NIST
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Ryan Epstein
NIST
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Jason Amini
NIST
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Kenton Brown
NIST
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Jonathan Home
NIST
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David Hume
NIST, University of Colorado
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Nobu Shiga
NIST
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Wayne Itano
NIST
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John Jost
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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Emmanuel Knill
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, Mathematical and Computing Science Division, National Institute of Standards and Technology, Boulder, Colorado 80305, National Institute of Standards and Technology, NIST
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Chris Langer
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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Roee Ozeri
National Institute of Standards and Technology, Boulder, Colorado 80305, USA, NIST
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David Wineland
NIST, NIST, Boulder, Colorado