Dielectric properties and band gap determination of individual nanostructures via valence electron energy loss spectroscopy

ORAL

Abstract

Recent developments in electron energy loss spectroscopy allow us to measure the dielectric properties near the band gap of the material with resolution better then 0.2 eV. The energy loss spectra in the 0-50 eV range carries information about the dielectric properties of the nanostructures providing information about the plasmon excitations and allows accurate bandgap determination of individual nanostructures.

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Authors

  • Shaul Aloni

    Molecular Foundry, MSD, LBNL, Berkeley, Caifornia 94720 and Dept. of Physics, UC Berkeley, California, 94720

  • David Okawa

    Dept. of Physics, UC Berkeley, California, 94720

  • Michael Johnson

    Materials Sciences Division, LBNL, Berkeley, Caifornia 94720

  • Michael Rousseas

    Dept. of Physics, UC Berkeley, California, 94720

  • Alex Zettl

    Center of Integrated Nanomechanical Systems and Department of Physics, University of California at Berkeley, Berkeley, CA 94720, University of California at Berkeley, Departments of Chemistry and Physics, University of California, Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory, Dept. of Physics, UC Berkeley, California, 94720 and Molecular Foundry, MSD, LBNL, Berkeley, Caifornia 94720, UC Berkeley, Lawrence Berkeley National Laboratory