The nonlinear effect of resistive inhomogeneities on van der Pauw measurements
ORAL
Abstract
The \textit{resistive weighting function} [D. W. Koon and C. J. Knickerbocker, Rev. Sci. Instrum. 63, 207 (1992)] quantifies the effect of small local inhomogeneities on van der Pauw resistivity measurements, but assumes such effects to be linear. This talk will describe deviations from linearity for a square van der Pauw geometry, modeled using a 5 x 5 grid network of discrete resistors and introducing both positive and negative perturbations to local resistors, covering nearly two orders of magnitude in -$\Delta \rho $/$\rho $ or -$\Delta \sigma $/$\sigma $. While there is a relatively modest quadratic nonlinearity for inhomogeneities of decreasing conductivity, the nonlinear term for inhomogeneities of decreasing resistivity is approximately cubic and can exceed the linear term.
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Authors
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Daniel W. Koon
St. Lawrence University