Testing of CRYO ASIC for the nEXO Experiment

nEXO is a next-generation liquid xenon experiment to search for the neutrinoless double beta decay of Xenon 136, with a lifetime sensitivity goal of greater than 10²⁸ years. The experiment will use a segmented anode to record ionization electrons and a cryogenic application-specific integrated circuit (ASIC) named CRYO ASIC for amplification and digitization of charge signals. This work presents the results of CRYO ASIC tests in a liquid xenon (LXe) environment. The CRYO ASIC was connected to an auxiliary board and placed in a test stand comprised of a chamber filled with LXe to mimic the nEXO experiment.