Plasma Etching I
ORAL · GT2 · ID: 3430234
Presentations
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Computational investigation on the effects of ion transport in HAR pattern MASK etching with Ar plasma
ORAL
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Presenters
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Byeong Yeop Choi
Chungnam National University
Authors
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Byeong Yeop Choi
Chungnam National University
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SiJun Kim
Chungnam Natl Univ
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Wonnyoung Jeong
Chungnam Natl Univ
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Youngseok Lee
Chungnam Natl Univ
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Inho Seong
Chungnam Natl Univ
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Chulhee Cho
Chungnam Natl Univ
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Minsu Choi
Chungnam Natl Univ
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ShinJae You
Chungnam National University
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Control of Ion Energy and Angle Distribution via Waveform-Driven Embedded Electrode in Capacitively coupled plasma by using two-dimensional particle in cell simulation
ORAL
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Presenters
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Seoi Choi
Pusan National University
Authors
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Seoi Choi
Pusan National University
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HaeJune Lee
Pusan National University
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Positive Pulse Voltage Superposition to an RF Electrode in a Dual-Frequency Capacitively Coupled Plasma for Relaxation of Positive Charging at Bottom of High Aspect Ratio Holes
ORAL
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Presenters
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Takuya Kikuchi
Nagoya University
Authors
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Takuya Kikuchi
Nagoya University
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Haruka Suzuki
Nagoya University; cLPS, Nagoya University
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Makoto Moriyama
Advanced Memory Development Center, Kioxia Corporation
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Kota Tamura
Frontier Technology R&D Institute, Kioxia Corporation.
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Kuboi Shuichi
Frontier Technology R&D Institute, Kioxia Corporation.
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Daiki Iino
Frontier Technology R&D Institute, Kioxia Corporation.
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Hiroyuki Fukumizu
Frontier Technology R&D Institute, Kioxia Corporation.
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Kazuaki Kurihara
Frontier Technology R&D Institute, Kioxia Corporation.
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Hirotaka Toyoda
Nagoya University; cLPS, Nagoya University, Nagoya University
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Remediation of Charging During Pulsed Plasma Etching of High Aspect Ratio Features in Dielectric Materials: Applications to Cryogenic Etching
ORAL
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Presenters
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Mark J Kushner
University of Michigan
Authors
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Chenyao Huang
University of Michigan - Ann Arbor
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Yeon Geun Yook
University of Michigan
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Yifan Gui
University of Michigan
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Mark J Kushner
University of Michigan
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Reliable wafer level plasma diagnostics under various rf bias power
ORAL
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Presenters
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Deok-Hwan Kim
Hanyang university, Department of Electrical Engineering, Hanyang University, Department of electrical engineering, Hanyang University, Seoul, Korea
Authors
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Deok-Hwan Kim
Hanyang university, Department of Electrical Engineering, Hanyang University, Department of electrical engineering, Hanyang University, Seoul, Korea
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Hyundong Eo
SEMES
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Oh-Chang Lee
Hanyang university
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Jae-Sung Park
Hanyang university
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Chin-Wook Chung
Hanyang University, Department of electrical engineering, Hanyang University, Seoul, Korea1
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