Diagnostics I
FOCUS · ET2 · ID: 1530142
Presentations
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New model for the ion collection by cylindrical probes over a wide range of collisionality
ORAL
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Presenters
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Julian Held
University of Minnesota
Authors
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Julian Held
University of Minnesota
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Willca Villafana
Princeton Plasma Physics Laboratory
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Igor D Kaganovich
Princeton Plasma Physics Laboratory
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Uwe R Kortshagen
University of Michigan, University of Minnesota
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Optical emission spectroscopy spatial characterization of a silicon based Micro Hollow Cathode Discharge operating in Helium in DC regime
ORAL
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Publication: [1] K. H. Schoenbach, R. Verhappen, and T. Tessnow, F. E. Peterkin, and W. W. Byszewski, "Microhollow cathode discharges," Appl. Phys. Lett., vol. 68, no. 1, p. 13-15, p. 4.Jan. 1996, doi: 10.1063/1.116739<br>[2] R. Michaud, V. Felix, A. Stolz, O. Aubry, P. Lefaucheux, S. Dzikowski, V. Schulz-von der Gathen, L. J. Overzet and R. Dussart et al., "Direct current microhollow cathode discharges on silicon devices operating in argon and helium," Plasma Sources Sci. Technol., vol. 27, no. 2, p. 025005, Feb. 2018, doi: 10.1088/1361-6595/aaa870.<br>[3] S. IseniIséni, R. Michaud, P. Lefaucheux, G. B. Sretenović, V. Schulz-von der Gathen, and R. Dussart, "On the validity of neutral gas temperature by emission spectroscopy in micro-discharges close to atmospheric pressure," Plasma Sources Sci. Technol., vol. 28, no. 6, p. 065003, May 2019, doi: 10.1088/1361-6595/ab1dfb.
Presenters
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Elane D KOUADOU
GREMI - Universite d'Orleans/CNRS
Authors
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Elane D KOUADOU
GREMI - Universite d'Orleans/CNRS
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Sylvain ISENI
GREMI, GREMI - Universite d'Orleans/CNRS
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Arnaud Stolz
GREMI - Universite d'Orleans/CNRS
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Philippe Lefaucheux
GREMI - Universite d'Orleans/CNRS
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Remi Dussart
GREMI - Universite d'Orleans/CNRS
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Electrical and Optical Diagnostics to Measure the Electron Plasma Frequency
ORAL · Invited
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Publication: [1] Kim et al., Appl. Phys. Lett. 83, 4725 (2003).<br>[2] Yeom et al., Plasma Sources Sci. Technol. 30 065012 (2021).<br>[3] Yeom et al., Appl. Phys. Lett. 122, 114103 (2023).<br>[4] Chae et al, Plasma Sources Sci. Technol. "Transmission spectrum of flat-cutoff sensor influenced by dielectric film" (submitted).<br>[5] Berger et al, Plasma Sources Sci. Technol. 27 12LT02 (2018).
Presenters
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Hyo-Chang Lee
Korea Aerospace University
Authors
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Hyo-Chang Lee
Korea Aerospace University
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Jung Hyung Kim
Korea Research Institute of Standards and Science
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HeeJung Yeom
Korea Research Institute of Standards and Science
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Gwang-Seok Chae
Korea Aerospace University
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ChanWon Park
Korea Research Institute of Standards and Science
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Birk Berger
Ruhr Univ Bochum
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Julian Schulze
Bochum University, Ruhr University Bochum, Germany, Ruhr-University Bochum
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Plasma-assisted Synthesis of Carbon Nanomaterial Studied by Spatially-resolved Laser-induced Fluorescence and Optical Emission Spectroscopy
ORAL
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Presenters
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Tanvi Nikhar
Michigan State University
Authors
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Tanvi Nikhar
Michigan State University
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Sankhadeep Basu
Michigan State University
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Shurik Yatom
C&J Nyheim Plasma Institute, Drexel University, Princeton Plasma Physics Laboratory, Princeton University, Princeton Plasma Physics Laboratory
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Yevgeny Raitses
Princeton Plasma Physics Laboratory
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Rebecca Anthony
Michigan State University
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Sergey V Baryshev
Michigan State University
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Brewster angle-cavity ringdown spectroscopy for low temperature plasma diagnostics
ORAL
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Presenters
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Chuji Wang
Mississippi State University
Authors
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Chuji Wang
Mississippi State University
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Rongrong W Cohen
Mississippi State University
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Development of hybrid fs/ps CARS for quantitative detection of molecular nonequilibrium and concentration imaging of Cl and O radicals
ORAL
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Presenters
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Christopher J Kliewer
Sandia National Laboratories
Authors
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Christopher J Kliewer
Sandia National Laboratories
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Scott A Steinmetz
Sandia National Laboratory
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Timothy Chen
Applied Materials, Inc.
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Method to Characterize Experimentally Linear and Nonlinear Growth of Electrostatic Waves in Low Temperature Plasmas
ORAL
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Presenters
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Benjamin A Jorns
University of Michigan, Univ. Michigan
Authors
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Benjamin A Jorns
University of Michigan, Univ. Michigan
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