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Calculation of SF6 Gas Contamination Rate Caused by Gas Flow Velocity with Changing Function of Gas Bluster Angle in Double-Flow Gas Circuit Breaker

POSTER

Abstract

The chamber size of SF6 gas circuit breaker is expected to get smaller than that of the current products. In addition, the re-ignition must prevent clearly. Thus, it is important to elucidate the transient phenomena of arc inside the extinguish chamber during the current interruption process. However, it is difficult to obtain the rapidly change of arc plasma with experiment, the numerical simulation is usually used to analyze the above process as well. the temperature volume of arc increases along with the electrode opening process during the actual interruption process of circuit breaker. Therefore, it is necessary to consider the electrode opening process for analyzing the thermal reignition. The most difficult part of simulating the electrode opening process is the treatment of boundary between arc plasma and electrode because the rapidly change of physical properties with time variation. In this research, SF6 gas contamination rate caused by gas flow velocity with changing function of gas bluster angle in double-flow gas circuit breaker was calculated. As a result, the nozzle moves with the opening process of electrodes, and it elucidate that the gas bluster angle increases the SF6 gas contamination into the arc.

Presenters

  • Wataru Fuse

    Tokyo city university

Authors

  • Wataru Fuse

    Tokyo city university

  • Yuki Suzuki

    Tokyo City University

  • Honoka Morishita

    Tokyo City University

  • Masahiro Takagi

    Tokyo City University

  • Yusuke Nemoto

    Tokyo City University

  • Zhenwei Ren

    Tokyo City University

  • Reggie C Gustilo

    De La Salle University

  • Toru Iwao

    Tokyo City University