A method to calculate uncertainties on dielectronic recombination rate coefficients

There is a need for uncertainties on calculated atomic data, for use in spectroscopic diagnostics and plasma modeling codes. The calculation of such uncertainties is a challenging problem, with much recent progress having been made by a number of groups. A general method is presented that can be used to assign uncertainties on atomic collision processes. It uses a Bayesian approach with a Markov Chain Monte-Carlo implementation. The method has been applied to dielectronic recombination, with results being illustrated for a number of iso-electronic sequences, showing good agreement with experimentally measured dielectronic recombination rate coefficients and the expected scaling with electron temperature and ion stage.