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The Onset of Silicon Nanoparticle Nucleation in a Low Temperature Plasma

ORAL

Abstract

Controlling the nucleation and growth of nanoparticles (NPs) in low temperature plasma systems is imperative for controlling the NP size distribution; and for some applications, such as chemical vapor deposition and polysilicon production, for preventing particle contamination. Although the mechanisms behind silicon NP nucleation and growth have been well studied, it is unclear how controllable system parameters, e.g., pressure and system geometry, affect the onset of NP nucleation. The diffusion of reactive silane species, particularly SiH2 and SiH3, is expected to significantly affect the feed concentration of silane required to nucleate silicon NPs (the nucleation onset concentration) due to losses at the reactor walls. Additionally, plasma parameters are expected to be significant as they are known to affect the size and structure of synthesized nanoparticles. In this work, the nucleation onset concentration was determined as a function of system pressure, applied plasma power, and reactor diameter for a tubular flow-through radiofrequency (RF) plasma generated using Ar/He/SiH4 gas mixtures. A quartz crystal microbalance (QCM) impactor was used to measure the total aerosol mass density after the plasma and thereby identify the nucleation onset. A comparison of the experimental results to a 2D multi-physics model will also be provided.

Presenters

  • Eric Husmann

    Washington University, St. Louis

Authors

  • Eric Husmann

    Washington University, St. Louis

  • Elijah J Thimsen

    Washington University, St. Louis, Washington University in St. Louis, Washington University in Saint Louis

  • Jordyn Polito

    University of Michigan, University of Michigan, Ann Arbor

  • Steven Lanham

    University of Michigan, University of Michigan, Ann Arbor

  • Mark J Kushner

    University of Michigan, University of Michigan, Ann Arbor, Electrical Engineering and Computer Science, University of Michigan, 1301 Beal Ave, Ann Arbor, MI 48109-2122, United States of America