X-Ray Diagnostic for Pulsed Power and Plasma Physics Experiments on Mykonos
POSTER
Abstract
A new electron beam-based X-radiography diagnostic system is being developed for the ~ 1 MA Mykonos Linear Transformer Driver (LTD) pulsed power device at Sandia National Laboratories. This system will complement existing Mykonos diagnostics such as visible cameras, photon doppler velocimetry, gated visible spectroscopy, and X-pinch backlighting radiography. While X-pinch back-lighter sources have the advantage of being bright point sources, they are limited to a single image per shot and have limited timing control. This new source will potentially provide better timing control and multiple images per shot. The X-ray source is a needle-and-washer electron beam diode, emitting an X-ray pulse of around 30ns, with interchangeable needle anodes of differing elements. This source will be fielded with an Ultra-fast Xray Imager (UXI) camera with a frame time as small as 4 ns, allowing for a clearer visualization of the events occurring during the experiment. System development and preliminary results will be described.
This work was supported by NNSA grant no. DE-NA0004135
SNL is managed and operated by NTESS under DOE NNSA contract DE-NA0003525
SAND2025-09507A
This work was supported by NNSA grant no. DE-NA0004135
SNL is managed and operated by NTESS under DOE NNSA contract DE-NA0003525
SAND2025-09507A
Presenters
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Alexander van Balderen
University of New Mexico
Authors
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Alexander van Balderen
University of New Mexico
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Tommy Ao
Sandia National Laboratories
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Jens Schwarz
Sandia National Laboratories
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Mark Gilmore
University Professor