Microtearing Mode Characterization with Charge eXchange Imaging on the DIII-D* Tokamak

POSTER

Abstract

Charge eXchange Imaging (CXI) measurements taken during H-mode hydrogen discharges with high density and current ramps provide strong evidence that microtearing modes become unstable above a critical density/plasma current and is localized near the peak electron pressure gradient despite changing rational surface position with Ip ramps. MTMs () are predicted to cause substantial electron thermal transport, limiting fusion performance on high-power devices. Localized 2D measurements of low-to-intermediate wavenumber inter-ELM density fluctuations in the DIII-D plasma edge are obtained using a new high radial resolution multichannel CXI diagnostic that analyzes the intensity of the CVI n=8-7 emission at 529 nm. Fluctuations are measured in a 12 (radial) x 2 (poloidal) array at 2 MHz with a resolution of ∆R ~ 0.4 cm and ∆Z ~ 1.2 cm located at ρ=0.9-1.05. The mode peaks near with a radial FWHM of 1.0 cm and a fluctuation amplitude of ñC/nC~5% with f~60 kHz in the lab frame. The mode features a broad spectral width [30-180 kHz] and propagates in the electron diamagnetic direction in the plasma frame. Magnetic fluctuation measurements obtained with the RIP System exhibit a similar spectral feature, suggesting the mode is electromagnetic.

Presenters

  • Maximillian Major

    University of Wisconsin - Madison

Authors

  • Maximillian Major

    University of Wisconsin - Madison

  • George R McKee

    University of Wisconsin-Madison, University of Wisconsin, Madison

  • Benedikt Geiger

    University of Wisconsin - Madison

  • Raymond John Fonck

    University of Wisconsin - Madison

  • Jie Chen

    University of California, Los Angeles

  • Filipp O Khabanov

    University of Wisconsin - Madison, Univ Wisconsin,Madison

  • Christopher Seyfert

    University of Wisconsin-Madison, University of Wisconsin - Madison

  • Zheng Yan

    University of Wisconsin - Madison, University of Wisconsin Madison

  • Lothar W Schmitz

    University of California Los Angeles, TAE Technologies, University of California, Los Angeles, University of California Los Angeles