Single Hit CCD Spectrometers for X-ray conversion efficiencies
POSTER
Abstract
X-ray conversion efficiency is often difficult to obtain given uncertainties of the detector sensitivity. CCD cameras with known distance and attenuation, for which less than one photon is detected per pixel, can provide absolute spectra via the image histogram, but noise, fluorescence, sky-shine, and charge splitting between pixels (“charge bleed”) are challenges. We present new results and explain features that were previously unnoticed. We found that most hits suffer from charge bleed which may be reversed by summing over neighboring pixels, but this process becomes increasingly inefficient at exposures for which charge-bled events overlap, resulting in a continuous background instead of well reconstructed spectral lines. We show compromises for signal strength versus quantitative fidelity, in which conversion efficiencies can be determined despite incomplete charge-bleed reversal. To demostrate the power of the diagnostic, we present the study of conversion efficincies for a laser-driven Cu-Ka source in dependence of laser-incidence angle and detector observation angle.
Presenters
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Matthias Geissel
Sandia National Laboratories
Authors
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Matthias Geissel
Sandia National Laboratories
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Tommy Ao
Sandia National Laboratories
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Quinn Looker
Sandia National Laboratories, Sandia National Lab
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Patrick K Rambo
Sandia National Laboratories
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Christopher T Seagle
Sandia National Laboratories
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Jonathon E Shores
Sandia National Laboratories
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Robert J Speas
Sandia National Laboratories
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Chi Yang
Sandia National Laboratories
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John L Porter
Sandia National Laboratories