Excessive electron emission from a velvet cathode

The Cathode Test Stand (CTS) at LANL is utilized to test velvet cathodes on microsecond timescales. At this pulse duration, velvet provides interesting results that are not fully documented or diagnosed. The CTS employs various diagnostics to measure voltage, extracted current, current density, and electron and x-ray scatter. Diagnostics show stochastic instances where the extracted current exceeds the space charge limit. Diamond Radiation Detectors (DRDs) and an ICCD are deployed to monitor excess electron emission and increased light signal on the cathode face. Here we will show correlations between these measurements,.