High-sensitivity plasma density characterization by cross-polarized temporal interferometry
ORAL
Abstract
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Publication: 1. Z. Nie, N. Nambu, K. A. Marsh, E. Welch, D. Matteo, C. Zhang, Y. Wu, S. Patchkovskii, F. Morales, O. Smirnova, and C. Joshi, "Cross-polarized common-path temporal interferometry for high-sensitivity strong-field ionization measurements," Opt. Express 30(14), 25696 (2022).<br>2. Z. Nie, K. A. Marsh, N. Nambu, C.-K. Huang, and C. Joshi, "Ultrafast High-Sensitivity Characterization of Refractive Index Transients Induced by Plasmas or Kerr Effect Using Cross-Polarized Common-Path Temporal Interferometry," in Conference on Lasers and Electro-Optics (OSA, 2021), p. STu2A.5.
Presenters
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Zan Nie
University of California, Los Angeles
Authors
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Zan Nie
University of California, Los Angeles
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Noa Nambu
University of California, Los Angeles
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Kenneth A Marsh
University of California, Los Angeles
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Eric C Welch
University of California, Los Angeles
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Daniel Matteo
University of California, Los Angeles
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Chaojie Zhang
UCLA, University of California, Los Angeles
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Yipeng Wu
University of California, Los Angeles
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Serguei Patchkovskii
Max Born Institute
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Felipe Morales
Max Born Institute
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Olga Smirnova
Max Born Inst
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Chandrashekhar Joshi
University of California, Los Angeles