Data analysis for the upgraded Thomson Scattering diagnostic in HSX

A data analysis code has been developed to calculate a joint PDF for electron temperature and density using Thomson Scattering (TS) in the Helically Symmetric eXperiment (HSX). The upgraded TS diagnostic features 1.25GS/s digitizers and newly designed high speed electronics that give a time-resolved pulse signal with significantly reduced noise and minimized deformation. This allows the use of curve fitting techniques to reduce uncertainty and improve accuracy of the resulting measurements. The PDF for electron temperature and density will be used in a future integrated data analysis (IDA) system that combines multiple diagnostics for higher fidelity profiles. A sensitivity analysis has been performed using Matlab and Simulink to predict how the system will function over a range of plasma parameters expected in the HSX upgrade, as well as determining the effects of noise sources on the calculated electron temperature and density values.