Near and on-substrate plasma characterization in pulsed laser deposition processes.
POSTER
Abstract
Although pulsed laser deposition (PLD) of thin films is a mature technique, the actual plasma processes and plasma properties close to the substrate have not been characterized in detail. We present a spectroscopic characterization of the near and on-substrate plasma using a Nd:YAG laser, 340 mJ, 3.5 ns, at 1.06 mm, focused on a rotating calcium doped graphite target, at ~2×109 W/cm2, in Argon background. Plasma temperature is inferred from Boltzmann plots of ArII lines and spectra fitting of C2 swan bands emission. CII and CaII Stark broadening of emission lines is used to infer the plasma electron density. A comparison is made between a free streaming and on substrate plasma. Characteristic temperatures of the free streaming plasma are in the range ~2.5±0.3 eV at early times, ~100 ns after laser plasma formation, which decreases to ~1.2±0.2 eV, at later times, ~560 ns, with electron density ~1016 cm-3. Characteristic plasma parameters for the on-substrate plasma are found to be ~0.8 eV and ~1018 cm-3, being the higher electron density attributed to on-substrate plasma stagnation. These observations contribute to a better understanding of the plasma processes in PLD.
Presenters
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Diego A Oportus
Pontificia Universidad Catolica de Chile, PontificiaUniversidad Catolica de Chile
Authors
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Diego A Oportus
Pontificia Universidad Catolica de Chile, PontificiaUniversidad Catolica de Chile
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Hugo M Ruiz
Universidad Técnica Federico Santa María
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Luis Sebastian Caballero Bendixsen
First Light Fusion, First Light Fusion Ltd
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Felipe Veloso
Pontificia Universidad Catolica de Chile, Pontif Univ Catolica de Chile
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Mario Favre
Pontificia Universidad Catolica de Chile, PontificiaUniversidad Catolica de Chile