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Single Hit CCD Spectrometers for X-ray conversion efficiencies (revisited)

ORAL

Abstract

Absolute conversion efficiencies from laser energy into X-rays are difficult to obtain given uncertainties in required filters and detector characteristics. A known method for measuring absolute X-ray flux is using a CCD camera that is placed far enough away and filtered well enough such that no more than one photon can be detected per pixel of the detector while maintaining precise knowledge of the attenuation. The image histogram then serves as an X-ray spectrum. However, remaining noise, fluorescence, sky-shine in ultra-intense laser experiments, and charge splitting to neighboring pixels are just a few complications that pose challenges to this diagnostic. We will present recent results with the Z-Petawatt and Z-Beamlet lasers and share observation and attempted explanation for spectral features from detector interactions that were previously unnoticed.

Presenters

  • Matthias Geissel

    SNL, Sandia National Laboratories

Authors

  • Matthias Geissel

    SNL, Sandia National Laboratories

  • Tommy Ao

    Sandia National Laboratories

  • Quinn Looker

    Sandia National Lab, Sandia National Labs, Sandia National Laboratories

  • Patrick K Rambo

    Sandia National Labs, Sandia National Laboratories

  • Christopher T Seagle

    Sandia National Laboratories

  • Luke Shulenburger

    Sandia National Laboratories

  • John L Porter

    Sandia National Laboratories, Sandia National Lab, Sandia National Labs