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Increasing the Reliability of Line Profile Measurements for White Dwarf Atmospheric Models

ORAL

Abstract

The white dwarf photosphere experiment uses the Z machine at Sandia National Labs to recreate the plasma conditions observed in the line-forming regions of white dwarf atmospheres (1 – 2 eV and 1016 – 1018 e/cm3).  Benchmark measurements of the line profiles used in models of white dwarf spectra are critical for assessing the reliability of fundamental white dwarf parameters derived from spectroscopic fits, which are quite sensitive to the details of the line shapes.  Reliable experimental determination of line shapes requires either relatively uniform plasma along our lines of sight (~12 cm long) or an accurate characterization of any nonuniformity.  In this talk, we will describe the modifications we have made to our experimental platform to allow measurements of gradients in our plasma and present the first results of these experiments.  We also discuss further platform enhancements that we are implementing to reduce systematic uncertainties and increase the reliability of our line shape measurements.

Presenters

  • Bart H Dunlap

    University of Texas at Austin

Authors

  • Bart H Dunlap

    University of Texas at Austin

  • Michael H Montgomery

    University of Texas - Austin, University of Texas at Austin, The University of Texas at Austin

  • Bryce Hobbs

    University of Texas at Austin

  • Patricia B Cho

    University of Texas at Austin

  • Don E Winget

    University of Texas - Austin, University of Texas at Austin

  • Thomas A Gomez

    Sandia National Laboratories

  • Sonal Patel

    Sandia National Laboratories

  • Marc-Andre Schaeuble

    Sandia National Laboratories

  • Taisuke Nagayama

    Sandia National Laboratories

  • James E Bailey

    Sandia National Laboratories

  • Georges S Jaar

    University of Nevada, Reno