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Time resolved measurement of electron density and temperature in NIF compressed capsules with the dHIRES x-ray spectrometer

POSTER

Abstract

The dHIRES x-ray spectrometer has been used to measure time resolved electron temperature (Te) and density (ne) in the hot spot of four NIF compressed capsules at stagnation from high resolution Kr helium-β x-ray spectra. The inferred, time averaged ne values mainly agree with ne values from neutron diagnostics within uncertainties, but neutron time of flight values of Tion are consistently higher than dHIRES Te values by 200 – 700 eV. The dHIRES measurements and measurement technique, uncertainty analysis, and discussion of comparisons with measurements with neutron diagnostics will be presented.

Presenters

  • Kenneth W Hill

    Princeton University, Princeton Plasma Physics Laboratory

Authors

  • Kenneth W Hill

    Princeton University, Princeton Plasma Physics Laboratory

  • M Bitter

    PPPL, Princeton University

  • Lan Gao

    Princeton Plasma Physics Laboratory, PPPL, Princeton University

  • Brian F Kraus

    Princeton Plasma Physics Laboratory, PPPL, Princeton Plasma Physics Laboratory (PPPL), USA

  • P.C. C Efthimion

    Princeton Plasma Physics Laboratory, PPPL

  • Novimir A Pablant

    Princeton Plasma Physics Laboratory, PPPL

  • Marilyn B Schneider

    Lawrence Livermore Natl Lab, LLNL

  • D.B. Thorn

    Lawrence Livermore Natl Lab, LLNL

  • Hui Chen

    Lawrence Livermore Natl Lab, Lawrence Livermore National Laboratory, LLNL

  • R.L. Kauffman

    LLNL

  • Duane A Liedahl

    Lawrence Livermore Natl Lab, LLNL

  • Michael J MacDonald

    Lawrence Livermore Natl Lab, LLNL, Lawrence Livermore National Laboratory

  • Andrew G MacPhee

    Lawrence Livermore Natl Lab, LLNL

  • S. Stoupin

    Lawrence Livermore Natl Lab, LLNL

  • R. Doron

    Weizmann Institute

  • E. Stambulchik

    Weizmann Institute

  • Y. Maron

    Weizmann Institute

  • B. G Lahmann

    Massachusetts Institute of Technology MIT, MIT