Combining X-Ray Thomson Scattering and X-Ray Raman Spectroscopy to Characterize Solid-Density Plasmas
ORAL
Abstract
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Authors
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Dominik Kraus
Helmholtz-Zentrum Dresden-Rossendorf
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Katja Voigt
Helmholtz-Zentrum Dresden-Rossendorf
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Min Zhang
Helmholtz-Zentrum Dresden-Rossendorf
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Kushal Ramakrishna
Helmholtz-Zentrum Dresden-Rossendorf
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Nicholas Hartley
Helmholtz-Zentrum Dresden-Rossendorf
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Anja Schuster
Helmholtz-Zentrum Dresden-Rossendorf
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Jan Vorberger
Helmholtz-Zentrum Dresden-Rossendorf
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Lingen Huang
Helmholtz-Zentrum Dresden-Rossendorf
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Deniza Chekrygina
Helmholtz-Zentrum Dresden-Rossendorf
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Michal Smid
Helmholtz-Zentrum Dresden-Rossendorf
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Toma Toncian
Helmholtz-Zentrum Dresden-Rossendorf
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Alexander Pelka
Helmholtz-Zentrum Dresden-Rossendorf
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Katerina Falk
Helmholtz-Zentrum Dresden-Rossendorf
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Marion Harmand
UPMC Paris
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Alexis Amouretti
UPMC Paris
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Stefan Hau-Riege
Lawrence Livermore National Laboratory, LLNL
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Tilo Doeppner
LLNL
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Luke Fletcher
SLAC National Accelerator Laboratory, SLAC, SLAC National Accelerator Laboratory, Menlo Park, 94025, California, USA
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Hae-Ja Lee
SLAC, LCLS
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Bob Nagler
SLAC, LCLS
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Roger Falcone
UC Berkeley
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Mikako Makita
European XFEL
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Karen Appel
European XFEL
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Thomas Preston
European XFEL
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Ulf Zastrau
European XFEL, European X-Ray Free-Electron Laser Facility GmbH