Hardware Upgrades for Microwave/Millimeter-Wave Diagnostics on LTX-β

POSTER

Abstract

Fluctuation measurements and their relation to transport will be of key interest in the LTX-β device, which will have higher BT and IP, and neutral beam heating. The microwave/millimeter-wave diagnostics on the device have been upgraded to enhance fluctuation measurements on the new machine. Faster data acquisition hardware with additional channels for the FM-CW (frequency-modulated continuous-wave) reflectometer (13.5-33 GHz) will increase the repetition rates to 200 kHz. New data acquisition hardware and a new detector for the 288 GHz interferometer will increase the S/N ratio as well as allow higher intermediate frequencies for robust tracking of the line density. New diagnostics include the two-channel tunable fixed-frequency quadrature reflectometer (13.5-20.5 and 27-40 GHz) and far-forward scattering (FFS) using the interferometer hardware. Optimization for FFS will require modifications to the interferometer beam transmission line. Future upgrade plans, as well as detailed descriptions and experimental data from the above diagnostics, will be presented.

Presenters

  • Shigeyuki Kubota

    University of California, Los Angeles, UCLA, Univ of California - Los Angeles

Authors

  • Shigeyuki Kubota

    University of California, Los Angeles, UCLA, Univ of California - Los Angeles

  • Dick Majeski

    Princeton Plasma Physics Laboratory, Princeton Plasma Phys Lab, PPPL

  • Roman Lantsov

    University of California, Los Angeles

  • Xuan V. Nguyen

    University of California, Los Angeles

  • William A Peebles

    University of California, Los Angeles, University of California Los Angeles

  • Terry L Rhodes

    Univ of California - Los Angeles, University of California, Los Angeles, UCLA, University of California Los Angeles

  • Robert Kaita

    Princeton Plasma Physics Laboratory