Study of Z-pinch Magnetic Fields and Sources of MeV Ions via Ion Deflectometry

ORAL

Abstract

In the deuterium gas-puff MA Z-pinch experiments on GIT-12, >30 MeV hydrogen ion beams are detected. Pinhole detectors show that the fast ions originate from annular sources. Ion deflectometry is used to investigate B-fields and ion sources by simulating deflected ion trajectories in Z-pinch plasmas. Analysis and interpretation of experimental and synthetic pinhole images demonstrate effects of magnetic fields and ion beam divergence. Thus, the spatial distribution of the ion source and magnitude of the averaged magnetic field are estimated.

Presenters

  • V. Munzar

    FEE CTU in Prague, Czech Tech Univ

Authors

  • V. Munzar

    FEE CTU in Prague, Czech Tech Univ

  • Daniel Klir

    FEE CTU in Prague, Czech Technical University in Prague, Faculty of Electrical Engineering, Department of Physics, Prague, Czech Republic, Czech Tech Univ

  • Jakub Cikhardt

    FEE CTU in Prague, Czech Technical University in Prague, Faculty of Electrical Engineering, Department of Physics, Prague, Czech Republic, Czech Tech Univ

  • B. Cikhardtova

    FEE CTU in Prague, Czech Tech Univ

  • J. Kravarik

    FEE CTU in Prague, Czech Tech Univ

  • P. Kubes

    FEE CTU in Prague, Czech Tech Univ

  • Karel Rezac

    FEE CTU in Prague, Czech Technical University in Prague, Faculty of Electrical Engineering, Department of Physics, Prague, Czech Republic, Czech Tech Univ

  • A. V. Shishlov

    IHCE in Tomsk

  • V. A. Kokshenev

    IHCE in Tomsk

  • R. K. Cherdizov

    IHCE in Tomsk

  • N. A. Ratakhin

    IHCE in Tomsk

  • K. Turek

    NPI CAS in Prague, NPI CAS