Integrated Zeff Analysis on the DIII-D Tokamak Combining Multiple Diagnostics

A new integrated data analysis workflow has been developed and implemented to more completely describe the plasma composition and effective charge Zeff, consistent with multiple independent diagnostic systems. This integrated analysis combines filtered visible bremsstrahlung (VB), filtered soft x-ray (SXR), survey spectroscopy (SPRED) and wavelength resolved spectroscopy VB and charge-exchange recombination (CER) emission to deduce plasma Zeff and individual impurity ion density profiles. Graphite plasma facing components in DIII-D suggest carbon as the dominant plasma impurity. However, boronization and seed radiative impurity studies, as well as background atmospheric impurities, introduce known impurities that may contribute to the effective charge. Key considerations for the analysis are contamination to the filtered VB emission due to charge-exchange, degradation of the SXR detector sensitivity, uncertainty in the absolute calibration of SPRED and CER, and contrasting sightlines that terminate at razor viewing dumps with those that do not.