Density and Temperature Measurements on the Microsecond X-Pinch

Several comprehensive experimental measurements have been conducted on the microsecond x-pinch. First, a two-frame Mach-Zehnder interferometer has been implemented for electron density measurements via a frequency doubled, pulsed Nd:YAG laser. The second frame is delayed from the first by 61 ns, which allows for same-shot time evolution dynamics to be observed. The measurements presented on the axial plasma jets complement previous schlieren imaging results. Secondly, time-integrated x-ray spectroscopy has been conducted with a flat crystal spectrometer and x-ray sensitive film. Results from aluminum x-pinches have demonstrated the presence of He- and H-like ionic states, allowing a determination of the electron temperature of the hot spots. Further results on the spectroscopy of other wire materials will also be presented. Lastly, a study of load optimization for x-ray yield on the microsecond pinch will also be presented.