Spectrally and angularly resolved x-ray scattering measurements of shock-compressed aluminum

Measurements of the strength in the ionic structure factor at various scattering angles is important for accurate first-principle calculations of material properties in the high pressure and temperature phase. In this study, spectrally resolved XRTS measurements in combination with proof-of-principle, single shot 2D angularly resolved x-ray scattering measurements of changes in the ion-ion correlation peak for both single and double (counter-propagating) shocks have been observed in Al foils. A binary 527 nm, 2 GW laser system available at the MEC station of the LCLS facility has been used to compress 25 $\mu $m and 50 $\mu $m thick Al targets approximately 2x and 3x the solid density respectively. A drive intensity of 6x10$^{14}$ W/cm$^{2}$ on each irradiated surface was used to generate high pressure shock waves into the sample while 8 keV x-rays from the LCLS were used to probe the compressed targets for both single and double shocked geometries. The results will show that the elastic x-ray scattering amplitude, angularly resolved, shifts to higher wave numbers with increasing density, while the width and peak amplitude provide information on the temperature and ionization state.