Design and implementation of the Materials Analysis Particle Probe (MAPP) plasma-facing component diagnostic

The Materials Analysis Particle Probe (MAPP) is capable of prompt shot-to-shot analysis of plasma-facing components samples exposed to NSTX plasma discharges. MAPP exposes four samples to individual plasma discharges in order to test novel materials and determine the effect on plasma-facing components. Spectroscopic analysis techniques include X-ray photoelectron spectroscopy, ion scattering spectroscopy, direct recoil spectroscopy, and thermal desorption spectroscopy. These techniques assess the chemical state of the near surface ($\sim $10 nm), the surface (1-2 monolayers), quantify hydrogen retention, and measure thermal desorption species, respectively. Characterization is performed during the between-shot time window without perturbing operations or other diagnostics. The present work discusses MAPP's current status, calibration, and implementation within LTX and NSTX.