Laser Cut X-pinches

POSTER

Abstract

We present experimental data from laser cut X-pinches in an effort to develop a reliable and efficient X-ray backlighting source for the characterization of ICF capsules. Temporal and spatial resolution of the pinch is resolved using wideband Si diodes and time integrated x-ray pinhole cameras respectively. A comparison is made between laser cut and traditionally arranged X- pinches in terms of X-ray emission intensity, point-source coherence, and reproducibility.

Authors

  • Gilbert Collins IV

    UC San Diego, University of California San Diego

  • Maria Pia Valdivia

    UC San Diego

  • Joohwan Kim

    UC San Diego, University of California San Diego

  • Jun Yi

    UC San Diego

  • Kanchana Gunasekera

    UC San Diego

  • Farhat Beg

    UCSD, UC San Diego, University of California San Diego, U California San Diego, University of California-San Diego, La Jolla, California 92093, USA, University of California-San Diego, USA

  • Richard Stephens

    General Atomics, GA