Modeling High-Voltage Breakdown for Single- and Multi-stack Dielectric Insulators

POSTER

Abstract

Breakdown from DC through microwave in dielectric-insulator configurations with one or more segments will be investigated using an improved 2D PIC simulation model [1]. The goal of this work is to develop the capability to predict and control the breakdown threshold under a wide range of parameters and geometries. Effects considered include secondary-emission [2], space-and surface-charge, ambient and desorbed gas, and surface-plasma generation for single- and multiple-layer [3] insulators with applied fields from DC to THz frequencies. Comparison between simulation and experiment will be conducted where possible. \\[4pt] [1] Taverniers, S., et al., ICOPS 2009 Proc., 2009.\\[0pt] [2] Vaughan, J.R.M., IEEE TED, Vol. 36, No. 9, 1989, pp.1963-1967.\\[0pt] [3] Leopold, J.G., et al., Proc. 2010 PMHVC.

Authors

  • Manuel Aldan

    Univ. of California, Berkeley

  • John Verboncoeur

    University of California, Berkeley, Department of Nuclear Engineering, University of California, Berkeley, Univ. of California, Berkeley, Department of Nuclear Engineering, University of California, Berkeley, CA

  • Y.Y. Lau

    Univ. of Michigan

  • John Booske

    University of Wisconsin, Univ. of Wisconsin, University of Wisconsin-Madison