Laser Plasma Wiggler

ORAL

Abstract

A high quality beam of X-rays is measured when electrons perform transverse oscillations in a Laser-Wakefield Accelerator. The radiation is spatially coherent, originates from a micron-sized source, has mrad divergence, 10 to 100 keV energy range and a peak brightness comparable to 3rd generation conventional light sources. Radiation post-processing of electron trajectories obtained from PIC modeling is in excellent agreement with the experimental results. Electron trajectories resemble the scenario of an electron in a wiggler-type insertion device. This is an important step on a route to realize a single stage table-top all optical x-ray source with unique characteristics and interests over the whole spectrum of scientific studies.

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Authors

  • S. Kneip

    Imperial College London, UK

  • S.P.D. Mangles

    Imperial College London, UK

  • C.A.J. Palmer

    Imperial college, Imperial College London, UK

  • S.R. Nagel

    Imperial College London, UK

  • C. Bellei

    Imperial College London, UK

  • J. Schreiber

    Imperial College London, UK

  • Z. Najmudin

    Imperial College London, UK

  • C. McGuffey

    University of Michigan, USA

  • V. Chvykov

    University of Michigan, USA

  • Franklin Dollar

    University of Michigan, USA, Center for Ultrafast Optical Sciences, Univ. of Michigan

  • C.M. Huntington

    University of Michigan, University of Michigan, USA, AOSS, University of Michigan

  • Ricardo Fonseca

    DCTI Instituto Superior de Ciencias do Trabalho e da Empresa, Instituto Superior Tecnico, Portugal, GoLP/IPFN - Instituto Superior Tecnico, GoLP/Instituto de Plasmas e Fus\~ao Nuclear, Instituto Superior T\'ecnico, Lisboa, Portugal, Instituto Superior T\'ecnico

  • G. Kalintchenko

    University of Michigan, USA

  • Anatoly Maksimchuk

    University of Michigan, USA, University of Michigan

  • T. Matsuoka

    University of Michigan, USA

  • Alec Thomas

    University of Michigan, University of Michigan, USA

  • V. Yanovsky

    University of Michigan, USA

  • Karl Krushelnick

    University of Michigan, USA, University of Michigan

  • Joana L. Martins

    Instituto Superior Tecnico, Portugal, GoLP/Instituto de Plasmas e Fus\~ao Nuclear, Instituto Superior T\'ecnico, Lisboa, Portugal, GoLP/IPFN, Instituto Superior T\'ecnico , Lisboa, Portugal

  • Samuel Martins

    GoLP, Instituto de Plasmas e Fusao Nuclear - Instituto Superior Tecnico, Lisbon, Portugal \& University of California Los Angeles, Los Angeles, USA, Instituto Superior Tecnico, Portugal, GoLP/IPFN - Instituto Superior Tecnico, University of California, Los Angeles

  • Luis O. Silva

    GoLP/IPFN Instituto Superior Tecnico, GoLP / Instituto de Plasmas e Fusao Nuclear, Instituto Superior Tecnico, Portugal, Instituto Superior Tecnico, Portugal, GoLP/IPFN - Instituto Superior Tecnico, GoLP/Instituto de Plasmas e Fus\~ao Nuclear, Instituto Superior T\'ecnico, Lisboa, Portugal, Instituto Superior T\'ecnico, GoLP, GoLP/IPFN, Instituto Superior T\'ecnico , Lisboa, Portugal

  • K. Ta Phuoc

    Laboratoire Optique Appliquee, France