MAPS based tracking and vertexing for the future Electron-Ion Collider

Momentum, angle, and position measurement of charged particles scattered and produced in collisions at the future Electron-Ion Collider (EIC) pose stringent requirements on the inner tracking and vertexing subsystem(s) of the EIC detector(s). Monolithic Active Pixel Sensors (MAPS) offer the possibility of high granularity in combination with low power consumption and low mass, making them ideally suited for these subsystems of the EIC detector(s). This talk will cover hardware R&D aspects towards a well-integrated, large-acceptance, precision tracking and vertexing solution for the EIC based on a new generation of MAPS in 65 nm CMOS imaging technology.