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Characterization of a Charged Particle Thermal Kinetic Inductance Detector (CP-TKID) Prototype

ORAL

Abstract



Precision nuclear physics experiments have long played an important role in searches for physics Beyond the Standard Model (BSM). The traditional particle detection technologies of many of these experiments, semiconductor and scintillation detectors, face fundamental performance limitations that greatly restrict the sensitivity achievable. A new detector paradigm for charged particle detection has the potential to dramatically improve sensitivity in BSM searches. We are working toward this goal by adapting Thermal Kinetic Inductance Detectors (TKIDs) for external charged particle detection. These cryogenic detectors, used in X-ray and gamma spectroscopy as well as dark matter searches, have shown photon energy resolutions on the order of tens of eV and can be multiplexed to create large area detectors. However, TKIDs have not yet been developed for non-embedded charged particle detection. We have designed a Charged Particle TKID (CP-TKID) prototype to optimized for the detection of the neutron beta decay electron. In this talk, we will discuss these prototype design constraints and the characterization of its response using an optical source.

Presenters

  • Elizabeth M Scott

    National Institute of Standards and Technology

Authors

  • Elizabeth M Scott

    National Institute of Standards and Technology

  • Hans P Mumm

    National Institute of Standards and Technology

  • Shannon M Hoogerheide

    National Institute of Standards and Technology, National Institute of Standards and Tech

  • Maynard Dewey

    National Institute of Standards and Tech, National Institute of Standards and Technology

  • Jimmy Caylor

    University of Tennessee, Syracuse University

  • Jiansong Gao

    National Institute of Standards and Technology

  • Michael R Vissers

    National Institute of Standards and Technology

  • Joel N Ullom

    National Institute of Standards and Technology Boulder

  • Jason Stevens

    National Institute of Standards and Technology

  • Jeffrey S Nico

    National Institute of Standards and Technology

  • Colin Heikes

    Northrop Grumman, University of Maryland, College Park