Characterization of a Charged Particle Thermal Kinetic Inductance Detector (CP-TKID) Prototype
ORAL
Abstract
Precision nuclear physics experiments have long played an important role in searches for physics Beyond the Standard Model (BSM). The traditional particle detection technologies of many of these experiments, semiconductor and scintillation detectors, face fundamental performance limitations that greatly restrict the sensitivity achievable. A new detector paradigm for charged particle detection has the potential to dramatically improve sensitivity in BSM searches. We are working toward this goal by adapting Thermal Kinetic Inductance Detectors (TKIDs) for external charged particle detection. These cryogenic detectors, used in X-ray and gamma spectroscopy as well as dark matter searches, have shown photon energy resolutions on the order of tens of eV and can be multiplexed to create large area detectors. However, TKIDs have not yet been developed for non-embedded charged particle detection. We have designed a Charged Particle TKID (CP-TKID) prototype to optimized for the detection of the neutron beta decay electron. In this talk, we will discuss these prototype design constraints and the characterization of its response using an optical source.
–
Presenters
-
Elizabeth M Scott
National Institute of Standards and Technology
Authors
-
Elizabeth M Scott
National Institute of Standards and Technology
-
Hans P Mumm
National Institute of Standards and Technology
-
Shannon M Hoogerheide
National Institute of Standards and Technology, National Institute of Standards and Tech
-
Maynard Dewey
National Institute of Standards and Tech, National Institute of Standards and Technology
-
Jimmy Caylor
University of Tennessee, Syracuse University
-
Jiansong Gao
National Institute of Standards and Technology
-
Michael R Vissers
National Institute of Standards and Technology
-
Joel N Ullom
National Institute of Standards and Technology Boulder
-
Jason Stevens
National Institute of Standards and Technology
-
Jeffrey S Nico
National Institute of Standards and Technology
-
Colin Heikes
Northrop Grumman, University of Maryland, College Park