Radiation-damage of single-crystal diamond detectors in swift heavy ion beams

ORAL

Abstract

Single-crystal diamond detectors fabricated by Chemical Vapor Deposition were irradiated with swift heavy ion beams in the energy range of 100-150 MeV/u at the National Superconducting Cyclotron Laboratory at Michigan State University. The degradation of the detector performance was monitored during irradiation by the output signal amplitude. After exposure to a particle fluence of 10$^{\mathrm{13}}$/cm$^{\mathrm{2}}$, the diamond samples were characterized by the Transient Current Technique to understand the effect of the beam induced damage in the charge transport properties.

Authors

  • Andreas Stolz

    National Superconducting Cyclotron Laboratory, Michigan State University

  • Ayan Bhattacharya

    Department of Electrical & Computer Engineering, Michigan State University

  • Timothy A. Grotjohn

    Department of Electrical & Computer Engineering, Michigan State University