Determination of the Thickness of the Back Dead-Layer of GRETINA Crystals via Comparisons of Measured Photopeak Efficiencies with GEANT4 Simulations

Measurements of the photopeak efficiency of the GRETINA array up to 3.5 MeV made at the National Superconducting Cyclotron Laboratory with 152Eu and 56Co sources were compared with GEANT 4 simulations. We developed a method of determining the average thickness of the back dead layers of the GRETINA crystals by considering the partial photopeak efficiencies of events including gamma-ray interactions in the back slice of the crystals. The impact of dead-layer thicknesses on the accuracy of simulated photopeak efficiencies and the ratio of photopeak counts measured in the two GRETINA crystal types is discussed.