Reducing Ambiguities in Spectroscopic Factors with Combined Measurements and the $^{86}$Kr(d,p) Reaction at 35MeV/u
ORAL
Abstract
Spectroscopic information for low-lying states above shell closures depends on the shape of the bound-state potential, which greatly affects the extracted spectroscopic factors. To mitigate this uncertainty, Mukhamedzhanov and Nunes [1] have proposed a combined method; the external portion is fixed with a peripheral reaction, and is combined with a higher energy measurement with a larger contribution from the interior. This will constrain the single-particle ANC, and should enable spectroscopic factors to be deduced with uncertainties dominated by cross-section measurements rather than the bound-state potential. Published measurements of $^{86}$Kr(d,p) at 5.5MeV/u [2] were used for the external contribution of this reaction. An ANC analysis shows that the reaction is peripheral at this energy and the ANC has been extracted. At less-peripheral energies, $^{86}$Kr(d,p) at 35MeV/u has been measured in inverse kinematics at the NSCL using the ORRUBA and SIDAR arrays of silicon strip detectors. Results of the ANC analysis and preliminary results from $^{86}$Kr(d,p) at 35MeV/u will be presented. This work is supported in part by the NSF and the U.S. DOE. [1] Phys.Rev.C 72, 017602 (2005) [2] Phys.Rev.C 1,938 (1970)
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Authors
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D. Walter
Rutgers University
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Jolie Cizewski
Rutgers University, Rutgers Univ
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Travis Baugher
Rutgers University, Rutgers
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Andrew Ratkiewicz
Rutgers University, Oak Ridge National Laboratory
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B. Manning
Rutgers University
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S.J. Lonsdale
Rutgers University
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S. Burcher
Rutgers University
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S.D. Pain
ORNL
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Kelly Chipps
ORNL, Oak Ridge National Laboratory
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Filomena Nunes
MSU, Michigan State University
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S. Ahn
MSU
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Thomas Baumann
MSU, NSCL
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Daniel Bazin
MSU, NSCL
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J. Pereira
MSU
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S. Williams
MSU
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P. Thompson
UT-Knoxville
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Giordano Cerizza
UT-Knoxville, Univ of Tennessee, Knoxville
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C. Thornsberry
UT-Knoxville
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K.L. Jones
UT-Knoxville
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D.W. Bardayan
Notre Dame
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P.D. O'Malley
Notre Dame
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R.L. Kozub
Tenn.Tech., Tennessee Technological University
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S. Ota
JAEA