High Speed Limited Angle X-ray Tomography for Optically Opaque Multiphase Flows
ORAL
Abstract
Non-intrusive, radiation based measurements can be used to characterize optically opaque multiphase flows. Direct quantification of volume fraction fields is critical to understanding such flows and validating computational models. X-ray based measurements such as densitometry (2-D) and tomography (3-D) allow for direct measurement of volume fraction regardless of opacity. However, at high speeds these methods are challenging and are not possible with conventional, off-the-shelf systems. A high speed, limited, angle Scanning Electron Beam X-ray Tomography (SEB-XT) has been developed at the University of Michigan (UM). The UM SEB-XT is capable of measuring 3-D volume fractions at speeds O(100 Hz) with resolutions of O(1mm). Testing is performed with a static phantom, a dynamic phantom, and a dispersed, steady state bubbly flow. Performance characterization and factors impacting image quality are discussed.
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Presenters
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Nicholas A Lucido
University of Michigan
Authors
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Nicholas A Lucido
University of Michigan
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Prachet Jain
University of Michigan
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Harish Ganesh
University of Michigan
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Steven L Ceccio
University of Michigan