Compressed representations and reduced order modeling of the turbulent flow response to roughness
ORAL
Abstract
All surfaces are hydrodynamically rough at sufficiently large Reynolds numbers. While the drag penalty of different engineering-relevant surfaces (sandgrain, biofouled, painted, etc.) can be characterized by various statistical parameters of the surfaces, finding a universal relationship between the flow response and arbitrary surfaces remains an open area of research.
In this work, a resolvent framework for forming compressed representations and reduced order models of the turbulent flow response to generalized roughness, without a-priori knowledge of the rough wall mean flow, is developed and applied in the case of a channel flow over sandgrain roughness. This framework is used to generate reduced representations which reproduce the wakefield fluctuations and dispersive stresses using less than 0.01% of the original degrees of freedom. Furthermore, using trends identified in data, this framework is used to form a predictive model for the dispersive stresses. The theoretical application of compressed representations and dispersive stress modeling to predicting global flow quantities is presented.
In this work, a resolvent framework for forming compressed representations and reduced order models of the turbulent flow response to generalized roughness, without a-priori knowledge of the rough wall mean flow, is developed and applied in the case of a channel flow over sandgrain roughness. This framework is used to generate reduced representations which reproduce the wakefield fluctuations and dispersive stresses using less than 0.01% of the original degrees of freedom. Furthermore, using trends identified in data, this framework is used to form a predictive model for the dispersive stresses. The theoretical application of compressed representations and dispersive stress modeling to predicting global flow quantities is presented.
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Presenters
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Miles J Chan
Caltech, California Institute of Technology
Authors
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Miles J Chan
Caltech, California Institute of Technology
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Ugo Piomelli
Queen's University
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Beverley J McKeon
Stanford University