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Droplet impact on highly deformable substrate and three-dimensional stress fields measurement by photoelastic tomography

ORAL

Abstract

Understanding the droplet impact behavior on soft substrates is important in many industrial technologies, such as 3D inkjet bioprinters. When the droplet impacts on the deformable substrate, energy loss due to substrate deformation, which depends on the impact stress, must be considered. Therefore, measurement of the three-dimensional (3D) stress field within the soft substrate is essential to understand the droplet impact. To do so, we use photoelasticity. When circularly polarized light enters a material under a stressed state, it exits as elliptically polarized light with photoelastic parameters, which depend on the stress state. Photoelastic tomography can be used to reconstruct the 3D stress field from the measured photoelastic parameters. We developed a novel photoelastic tomography algorithm, combining vector tomography and conventional photoelastic tomography. Linear interpolation and matrix calculations are used to improve the conventional method. We applied this tomography algorithm for the droplet impact onto a soft substrate which is an unsteady phenomenon. We simultaneously measured droplet impact on a highly deformable substrate (gelatin gel) and the stress field in the substrate using a high-speed polarization camera.

Publication: 1. Benjamin Mitchell, Yuto Yokoyama, Ali Nassiri, Yoshiyuki Tagawa, Yannis Korkolis, Brad Kinsey, An investigation of Hertzian contact in soft materials using photoelastic tomography, arXiv:2207.03900, (2022).<br>2. Yuto Yokoyama, Benjamin R. Mitchell, Ali Nassiri, Brad L. Kinsey, Yannis P. Korkolis, Yoshiyuki Tagawa, Integrated Photoelasticity in a Soft Material: Phase Retardation, Azimuthal Angle, and Stress-Optic Coefficient, submitted to Optics and Lasers in Engineering, available at SSRN: https://ssrn.com/abstract=4171604 (2022).

Presenters

  • Yuto Yokoyama

    Tokyo Univ of Agri & Tech, Tokyo University of Agriculture and Technology

Authors

  • Yuto Yokoyama

    Tokyo Univ of Agri & Tech, Tokyo University of Agriculture and Technology

  • Sayaka Ichihara

    Tokyo Univ of Agri & Tech

  • Benjamin R Mitchell

    University of New Hampshire

  • Ali Nassiri

    The Ohio State University

  • Brad L Kinsey

    University of New Hampshire

  • Yannis P Korkolis

    The Ohio State University

  • Yoshiyuki Tagawa

    Tokyo Univ of Agri & Tech, Tokyo University of Agriculture and Technology,