Numerical study of internal flow behavior at low vacuum in semiconductor industry
ORAL
Abstract
In the semiconductor industry, internal flow, especially occurring in a vacuum, is of interest because it is important to estimate particle behavior by fluid flow. resulting in defects that significantly affect the loss of mass production. However, due to the lack of experimental data on vacuum flow properties, it is difficult to accurately predict or analyze flow behavior, and thus we rely on the flow simulation by assuming the flow as a continuum. In the present study, we have conducted flow simulation using commercial package ANSYS, despite being used due to the low computational cost requirements of industrial processes, to estimate particle behavior caused by vacuum flow inside the semiconductor equipment such as extreme ultraviolet (EUV) machinery and gas transport pipeline. The continuum Navier-Stokes equations together with particle dynamics were used to predict particle and flow behaviors and the results are in quite good agreement with inspection results or equipment tendency.
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Presenters
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Injae Lee
Samsung Electronics
Authors
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Injae Lee
Samsung Electronics
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Yebin Nam
Samsung Electronics
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Ki-Hoon Kim
Samsung Electronics
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Sanghoon Lee
Samsung Electronics
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Sunghyup Kim
Samsung Electronics
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Sung-Gwang Lee
Seoul Natl Univ, Seoul National University
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Han June Park
Seoul Natl Univ, Seoul National University
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Wontae Hwang
Seoul National University